Committees > Technical Program
| Technical Program Chairs |
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| Fabrice CAIGNET |
LAAS-CNRS, University of Toulouse (France) |
| Hélène FREMONT |
IMS, University of Bordeaux (France) |
| Nathalie LABAT |
IMS, University of Bordeaux (France) |
| François MARC |
IMS, University of Bordeaux (France) |
| |
| Sub-committee Chairs |
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Topic A: Quality and Reliability assessment techniques and methods for Devices and Systems
|
| Enrique MIRANDA |
Universitat Autònoma de Barcelona (Spain) |
| Cora SALM |
University of Twente (Netherlands) |
| Ninoslav D. STOJADINOVIC |
University of Nis (Serbia) |
| |
Topic B: Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
|
| Alain BRAVAIX |
IM2PN-CNRS, ISEN (France) |
| Gabriella GHIDINI |
STMicroelectronics (Italy) |
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Topic C: Progress in Failure Analysis: Defect Detection and Analysis
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| Ingrid DE WOLF |
IMEC (Belgium) |
| Julien GOXE |
NXP (France) |
| Giovanna MURA |
University of Cagliari (Italy) |
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Topic D: Reliability of Microwave devices and circuits
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| Michael DAMMANN |
Fraunhofer IAF (Germany) |
| Nathalie MALBERT |
IMS, University of Bordeaux (France) |
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Topic E: Packaging and Assembly Reliability and Failure Analysis
|
| Alexandrine GUÉDON-GRACIA |
IMS, University of Bordeaux (France) |
| Julien PERRAUD |
THALES (France) |
| Kirsten WEIDE-ZAAGE |
University of Hannover (Germany) |
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| F : Power Devices and Electronic System : Reliability and Failure Analysis |
Topic F1: Smart-power devices, IGBT, Thyristors
|
| Mauro CIAPPA |
ETH Zurich (Switzerland) |
| Evgueniy STEFANOV |
NXP (France) |
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Topic F2: SiC and GaN power devices
|
| Matteo MENEGHINI |
University of Padova (Italy) |
| Frédéric MORANCHO |
LAAS-CNRS, University of Toulouse (France) |
| Loic THEOLIER |
IMS, University of Bordeaux (France) |
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Topic F3: Power Electronic System reliability
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| Olivier CREPEL |
AIRBUS (France) |
| Francesco IANNUZZO |
University of Aalborg (Denmark) |
| Wuhua LI |
University of Zhejiang (China) |
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Topic G: Photonics Reliability
|
| Massimo VANZI |
University of Cagliari (Italy) |
| Alain BENSOUSSAN |
Thales Alénia Space – IRT Saint-Exupery(France) |
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Topic H: MEMS and sensors Reliability
|
| Stefan OBERHOFF |
Robert Bosch GmbH (Germany) |
| Jérémie DHENNIN |
ELEMCA (France) |
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| I : Extreme environments and Radiation |
Topic I1: ESD-EOS, Latchup
|
| Philippe GALY |
STMicroelectronics (France) |
| Dionyz POGANY |
Vienna University of Technology (Austria) |
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Topic I2: EMC-EMI (integrated circuits, power electronic systems)
|
| Tristan DUBOIS |
IMS, University of Bordeaux (France) |
| Christian MAROT |
AIRBUS (France) |
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Topic I3: Radiation impact on circuits and systems reliability
|
| Julien MEKKI |
CNES (France) |
| Slawosz UZNANSKI |
CERN (Switzerland) |
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| SS : Special Session "Space and Aeronautic systems" |
| Michel LABRUNEE |
CNES (France) |
| Philippe PONS |
Aerospace Valley (France) |
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