Papers are requested on the following topics:
A - Quality and Reliability assessment techniques and methods for Devices and Systems
- Design for reliability, Built-in reliability,
- Virtual qualification, Reliability simulation,
- Advanced models for Reliability prediction,
- Reliability test structures, Limits to accelerated tests,
- Screening methods, Yield/reliability relationship,
- Obsolescence, Counterfeit.
B – Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
- Process-related issues, Passivation stability,
- Hot carriers injection, NBTI, TDDB,
- High-K dielectrics and gate stacks,
- Low-K dielectrics and Cu interconnects,
- Metal migration: mechanical and thermal aspects,
- Non-volatile and programmable cells,
- Silicon on Insulator devices,
- Nano-electronics, Nano-electronic materials for solid state devices.
C – Progress in Failure Analysis: Defect Detection and Analysis
- Electron, ion and optical beam techniques,
- Scanning probe techniques,
- Static or dynamic techniques, Backside techniques,
- Acoustic microscopy,
- Electric or magnetic field based techniques,
- Electrical, thermal and thermo-mechanical characterization,
- Sample preparation, construction analysis,
- Failure analysis: case studies.
D – Reliability of Microwave devices and circuits
- Wide band gap semiconductors,
- Microwave and compound semiconductor devices.
E - Packaging and Assembly Reliability and Failure Analysis
- Electrical Modeling & Simulations,
- Mechanical Modeling & Simulations,
- 3D / TSV, Flip chip, Advanced substrates,
- Chip/package interaction.
F - Power Devices and Electronic System : Reliability and Failure Analysis
F1 - Smart-power devices, IGBT, thyristors,
F2 - SiC and GaN power devices
F3 - Power Electronic System reliability
G – Photonics Reliability
- Solar Cells and Display,
- Optoelectronics,
- Organic electronics: OLED, Electronic Ink, TFT
H – MEMS and sensors Reliability
- Bio-electronics, Bio-sensors, Nano-Bio-technologies,
- MEMS and MOEMS,
- NEMS and nano-objects.
I - Extreme environments and Radiation
I1 - ESD-EOS, Latchup
I2 - EMC-EMI (integrated circuits, power electronic systems),
I3 - Radiation impact on circuits and systems reliability.
SS : Special Session "Space and Aeronautic systems"
This session will be dedicated to clustering the specific papers submitted from this domain among the different topics (A to I).
